The aging test is often simplified to a few hours of lighting, and the actual judgment relies on before-and-after comparison. The power-on time, stress temperature, and retest parameters must be fixed first before the results can be used for batch release and process improvement.

The role of aging is to screen out early failures

Failure can be roughly divided into three stages over time: early failure, accidental period and loss period. Aging before leaving the factory focuses on the first stage, stimulating potential defects in the factory instead of extending the service life. The stress temperature is set to a level that is higher than the normal operating temperature but does not damage the device. The excitation speed is significantly different for each higher level of temperature, so the duration and temperature must be written clearly in pairs. There is no comparability if only the number of hours is reported.

Retest to see the drift of four types of parameters

• The luminous power decreases and the threshold current increases, reflecting the laser status.
• Deterioration of extinction ratio is often accompanied by temperature rise on the drive side
• Changes in receiving sensitivity determine how much link margin is left
• The difference between the value reported by DDM and the actual measurement by the instrument has expanded, indicating that the monitoring channel drifts

Determine batch consistency, not a single sample

If a single drift is too large, it needs to be retested to confirm. Only if the entire batch drifts in the same direction, the line needs to be stopped to check the process. The readings before and after aging should be placed on the same table and measured with the same instrument and the same test line. The difference across instruments cannot be determined directly. Release testing and life assessment should also be separated: the former is done on a batch basis without damaging the device, while the latter is done on a sampling basis.25G DAC high speed cable and Data center high-speed interconnection solutionThe high-temperature power-on project here belongs to the release side. The higher the rate, the more it depends on the bit error performance under continuous operation.

It is more effective to write the aging time, stress temperature, retest items and judgment thresholds into the order than to ask afterward whether aging has been done. Wolflight provides a strict aging program for high-speed gears, call 0755-83179002.